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Note: Some smaller tools may not have individual pages here but can be found listed on specific Focus Facility pages (e.g., Cleanroom Metrology, Materials Prep). >>>Click here to return to Browse by Focus Facility page.Atomic force microscopy
Asylum Research Cypher VRS AFM
Bruker Dimension Icon SPM
Cleanroom metrology
Asylum Research Jupiter XR AFM
Hitachi Regulus 8100 SEM
NanoOne 3D Printer from UpNano
Zeiss Sigma 300 SEM
CryoEM
Aquilos Cryo-FIB/SEM
Chameleon
Talos Arctica G2 Cryo-TEM
Titan Krios G3i Cryo-TEM
Vitrobot Mark IV
Electron-beam lithography
Elionix F125
Elionix HS-50
Electron microscopy
FEI Helios Nanolab 600 Dual Beam System
FEI Tecnai Multipurpose Digital TEM
FIB-SEM VELION
Gemini 450 SEM
Hitachi HF 5000 Environmental S/TEM
JEOL 2010 FEG Analytical Electron Microscope
JEOL 2011 High Contrast TEM
Sigma HD VP SEM
Themis Z G3 Cs-Corrected S/TEM
Zeiss Merlin High-resolution SEM
Magnetic materials characterization
Quantum Design Inc. Magnetic Property Measurement System (MPMS-3)
Optical spectroscopy
Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer
Perkin Elmer 1050 UVVISNIR Spectrophotometer
Renishaw Invia Reflex Micro Raman
Thermo Fisher FTIR6700 Fourier Transform Infrared Spectrometer
Thermo Fisher Nicolet iS50 Fourier Transform Infrared Spectrometer and Continuum FTIR Microscope
WITec alpha300 apyron Confocal Raman
Surface analysis
Bruker Dektak DXT-A Stylus Profilometer
PHI VersaProbe II X-ray Photoelectron Spectrometer
Physical Electronics Model 700 Scanning Auger Nanoprobe
Quartz Crystal Microbalance with Dissipation
X-Ray diffraction & imaging
Bruker D8 GADDS
Bruker D8 HRXRD
Bruker Tracer-iii Handheld XRF
Multiwire Labs Back-Reflection Laue
PANalytical Empyrean
PANalytical X’Pert PRO
Rigaku SmartLab
SAXSLAB Retro-F
