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Hitachi Regulus 8100 SEM

Hitachi Regulus 8100 SEM, is a field emission scanning electron microscope. The instrument is located in the 3rd level cleanroom of MIT.nano and offers a superior low kV performance approaching 1.1 nm at 1kV. 

Specifications/Capabilities
  • Magnification: x20-1M
  • Acceleration: Voltage 0.5-30kV
  • Probe current: up to 20nA
  • 5-axes motorized eucentric specimen stage (X,Y=50mm, Z=30mm, T=-5deg-70deg, R-360deg)

Detectors

  • Everhart Thornley Secondary Electron Detector
  • Inlens Secondary Electron Detector
  • EDS Detector
Staff/Contact

Connor Moorman
12-0184

James M. Daley
12-0184           

Anna Osherov, PhD
12-5005                           

CONTACT

ASSISTED USE TRAINING REQUEST

GROUP TRAININGS
 

8100 sem
Reservation Rules

Obtaining access to the cleanroom is a prerequisite for Hitachi Regulus 8100 SEM training and usage

 

Location

MIT.nano 3rd level cleanroom 
60 Vassar Street (rear)
Cambridge, MA