The DektakXT system takes measurements electromechanically by moving a diamond-tipped stylus over the sample surface according to a user-programmed scan length, speed, and stylus force. The stylus is linked to a Linear Variable Differential Transformer (LDVT), which produces and processes electrical signals that correspond to surface variations of the sample. After being converted to digital format, these surface variations are stored for display and analysis.
The Vision64 application calculates and displays the results of user-selected analytical functions for measuring surface texture and other parameters to characterize the profile data. For example, the Ra (average roughness) analytical function—the most commonly used international parameter of roughness—calculates the arithmetic average deviation from the mean line within the assessment length. If there is an active database, selected analytical functions are logged to it during each measurement.
Common applications include measurements on thin films.
Bruker Dimension Icon SPM
Asylum Research Cypher VRS AFM
